• Secondary Ion Mass Spectrometry in the Earth Sciences: Gleaning the Big Picture from a Small Spot

Secondary Ion Mass Spectrometry in the Earth Sciences: Gleaning the Big Picture from a Small Spot

Secondary Ion Mass Spectrometry in the Earth Sciences: Gleaning the Big Picture from a Small Spot

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Secondary Ion Mass Spectrometry in the Earth Sciences: Gleaning the Big Picture from a Small Spot

Secondary Ion Mass Spectrometry in the Earth Sciences: Gleaning the Big Picture from a Small Spot

$19.08
$19.08 $28.91
SAVE 34% Sold out

Topics in Mineral Sciences Volume 41

Editor: M. Fayek

This short course volume introduces SIMS analytical techniques and assesses their applications in the Earth sciences. Topics include light stable and non-traditional isotope analysis, radiogenic isotope analysis quaternary geochronology, and depth profiling techniques.

Softcover. 160 pages. 2009.

ISBN: 978-0-921294-50-4

 

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